The Fraunhofer ISIT team will be on site to learn about the latest developments and trends in power electronics and to exchange ideas with industry experts. In addition, ISIT researcher Helge Schimanski will give a presentation on current research topics.
We look forward to an exciting exchange and welcome your requests for meetings.
In his presentation “Quality Assurance Reimagined—From Error to Optimized Process” ISIT researcher Helge Schimanski will present innovative research approaches for the further development and improvement of quality assurance.
After all, quality assurance is not just the responsibility of manufacturing. Optimizing manufacturing processes requires a reliable data foundation. A targeted failure analysis based on a properly defined problem statement provides the necessary information for this. This, in turn, forms the basis for investigating and preventing the causes of failures in the future, which ultimately leads to improved incoming quality and optimized manufacturing processes. This lays the foundation for reliable electronics and guaranteed functionality of electronic products throughout their product lifecycle.
Using illustrative real-world examples, he will present the approach to investigating the causes of defects, including 3D X-ray inspection and target preparation as a means of cross-section analysis and describe the resulting recommendations for process optimization.
Presentation details:
October 7, 2026 | 12:00–12:30 p.m. | EFX Stage