Sensor + Test 2026

Our researchers will present the following topics at the Sensor + Test

  • PowderMEMS® Technology for Innovative Microsystems
  • Monolithic Back-Biased Hall Sensor
  • PFAS-Free Environmental Protection Caps for MEMS Gas and Pressure Sensors 
  • Integrated Micromagnets for NV Quantum Sensors

Fraunhofer ISIT has developed a patented process for creating three-dimensional microstructures at wafer-level. This technology enables the integration of micromagnets, thermal insulation, and microfluidic channels into next-generation microsystems. PowderMEMS® offers significant advantages over other methods and allows for precise design of 3D structures, making it ideal for applications in magnetic MEMS, microfluidics, and microelectronics. Visit our stand to learn more about the unique possibilities of PowderMEMS® technology!

 

Mehr Info

Along with Fraunhofer IIS, ISIT will present the world’s smallest back-biased 3D Hall sensor. By combining the proven HallInOne® technology with PowderMEMS® micromagnets, bias magnets are integrated directly at wafer-level. This eliminates the need for external mounting and allows for application-specific design of the bias field.

 

 

Fraunhofer ISIT offers PFAS-free, gas-permeable environmental protection caps that are integrated directly into 8” silicon wafers using the innovative PowderMEMS® process. These caps protect MEMS sensors from harmful environmental influences such as particles and moisture, while simultaneously eliminating the need for separate chip processes.

 

At Sensor+Test the innovative process developed by Fraunhofer ISIT will be presented, which enables the integration of high-performance PowderMEMS® micromagnets at the wafer level, thereby facilitating the development of highly compact, NV-based quantum sensors.

This technology makes it possible to generate precise magnetic bias fields directly at the chip level. As a result, PowderMEMS® offers decisive advantages for next-generation quantum hardware.

Your on-site contacts

Dr. Björn Gojdka

E-Mail: 

bjoern.gojdka@isit.fraunhofer.de

Telefon

+494821173465

Dr.-Ing. Ole Behrmann

E-Mail

ole.behrmann@isit.fraunhofer.de

Telefon

+494821173417

Conference presentation by our researcher – poster presentation

Wafer-integrated PowderMEMS® micromagnets: CMOS-compatible bias field sources for modern sensor applications

 

At Sensoren 2026, ISIT will present wafer-integrated PowderMEMS® micromagnets—a key technology for cutting-edge MEMS magnetic sensor applications.

The focus is on the world’s smallest back-biased 3D Hall sensor. In addition, a miniaturized AMR sensor for current measurement and the application of PowderMEMS® micromagnets in NV quantum sensing will be presented.

Sensor + Test

The SENSOR+TEST is the world's leading forum for sensor, measuring and testing technology, attracting numerous companies and visitors from various countries. The event offers a platform for the exchange of specialist knowledge and developments in the industry.

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